Package | fhir.dicom |
Resource Type | ValueSet |
Id | dicom-cid-4251-VisualFieldStaticPerimetryTestStrategy |
FHIR Version | R4 |
Source | http://fhir.org/packages/fhir.dicom/http://dicom.nema.org/medical/dicom/current/output/chtml/part16/sect_CID_4251.html |
URL | http://dicom.nema.org/medical/dicom/current/output/chtml/part16/sect_CID_4251.html |
Version | 2025.3.20250714 |
Status | active |
Date | 2025-07-14 |
Name | VisualFieldStaticPerimetryTestStrategy |
Realm | us |
Authority | hl7 |
Description | Transitive closure of CID 4251 VisualFieldStaticPerimetryTestStrategy |
Copyright | © 2025 NEMA |
No resources found
CodeSystem | |
DCM | DICOM Controlled Terminology |
No narrative content found in resource
{ "resourceType": "ValueSet", "id": "dicom-cid-4251-VisualFieldStaticPerimetryTestStrategy", "url": "http://dicom.nema.org/medical/dicom/current/output/chtml/part16/sect_CID_4251.html", "identifier": [ { "system": "urn:ietf:rfc:3986", "value": "urn:oid:1.2.840.10008.6.1.910" } ], "version": "2025.3.20250714", "name": "VisualFieldStaticPerimetryTestStrategy", "status": "active", "experimental": false, "date": "2025-07-14", "publisher": "NEMA MITA DICOM", "description": "Transitive closure of CID 4251 VisualFieldStaticPerimetryTestStrategy", "copyright": "© 2025 NEMA", "compose": { "include": [ { "system": "http://dicom.nema.org/resources/ontology/DCM", "concept": [ { "code": "111825", "display": "Visual Field TOP Test Strategy" }, { "code": "111836", "display": "Visual Field CLIP Test Strategy" }, { "code": "111815", "display": "Visual Field SITA-Standard Test Strategy" }, { "code": "111826", "display": "Visual Field Dynamic Test Strategy" }, { "code": "111837", "display": "Visual Field CLASS Strategy" }, { "code": "111816", "display": "Visual Field SITA-SWAP Test Strategy" }, { "code": "111827", "display": "Visual Field Normal Test Strategy" }, { "code": "111817", "display": "Visual Field SITA-Fast Test Strategy" }, { "code": "111828", "display": "Visual Field 1-LT Test Strategy" }, { "code": "111818", "display": "Visual Field Full Threshold Test Strategy" }, { "code": "111829", "display": "Visual Field 2-LT Test Strategy" }, { "code": "111819", "display": "Visual Field FastPac Test Strategy" }, { "code": "111830", "display": "Visual Field LVS Test Strategy" }, { "code": "111820", "display": "Visual Field Full From Prior Test Strategy" }, { "code": "111831", "display": "Visual Field GATE Test Strategy" }, { "code": "111821", "display": "Visual Field Optima Test Strategy" }, { "code": "111832", "display": "Visual Field GATEi Test Strategy" }, { "code": "111822", "display": "Visual Field Two-Zone Test Strategy" }, { "code": "111833", "display": "Visual Field 2LT-Dynamic Test Strategy" }, { "code": "111823", "display": "Visual Field Three-Zone Test Strategy" }, { "code": "111834", "display": "Visual Field 2LT-Normal Test Strategy" }, { "code": "111824", "display": "Visual Field Quantify-Defects Test Strategy" }, { "code": "111835", "display": "Visual Field Fast Threshold Test Strategy" } ] } ] } }